GOULD, R. M., LEE, W., GIERLICH, H., THIAGARAJAN, N.
American Institute of Chemical Engineers
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Taylor, C. E., Noceti, R. P., D'Este, J. R., Martello, D. V.
Elsevier
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Shi, X., Chen, J.F., Hsu, S., Van Den Broeke, D.J., Socha, R.J., Chang, C.H., Dai, C.-M.
SPIE-The International Society for Optical Engineering
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Sanfilippo, D., Buonomo, F., Fusco, G., Miracca, I., Kotelnikov, G. R.
Elsevier
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Lee, K. H., Burdett, I. D., Cai, P., Eisinger, R S.
American Institute of Chemical Engineers
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Snip, O. C., Korbee, R., Schouten, J. C., van den Bleek, C. M.
American Institute of Chemical Engineers
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Occelli, M. L., Gould, S. A. C.
Elsevier
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LEVENSPIEL, O., LARSON, M. B., ZHANG, G. -T., OUYANG, F.
American Institute of Chemical Engineers
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CHANG, C. C., NEOGI, D., WALAWENDER, W. P., FAN, L. T.
American Institute of Chemical Engineers
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Kotelnikov, G. R., Komarov, S. M., Bespalov, V. P., Sanfilippo, D., Miracca, I.
Elsevier
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Park, Tae-Yun, Froment, Gilbert F.
American Institute of Chemical Engineers
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Occelli, M. L., Gould, S. A. C., Stucky, G. D.
Elsevier
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