Blank Cover Image

Fundamental Modeling of Transient-Enhanced Diffusion Through Extended Defect Evolution

Author(s):
Publication title:
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
469
Pub. Year:
1997
Page(from):
359
Pub. info.:
Pittsburg, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993730 [1558993738]
Language:
English
Call no.:
M23500/469
Type:
Conference Proceedings

Similar Items:

Gencer, A.H., Dunham, S.T.

Electrochemical Society

Clejan, I., Dunham, S.T.

Electrochemical Society

Gencer, Alp H., Dunham, Scott T.

MRS - Materials Research Society

Chakravarthi, Srinivasan, Gencer, Alp H., Dunham, Scott T., Downey, Daniel F.

Materials Research Society

Gencer, Alp H., Dunham, Scott T.

MRS - Materials Research Society

Dunham, S.T., Wittel, F.

Electrochemical Society

Clejan, I., Dunham, S.T.

Electrochemical Society

Dunham, S.T.

Electrochemical Society

Gencer, Alp H., Dunham, Scott T.

MRS - Materials Research Society

Li, J., Keys, P., Chen, J., Law, M. E., Jones, K. S., Jasper, C.

MRS - Materials Research Society

Chakravarthi, Srinivasan, Dunham, Scott T.

MRS - Materials Research Society

Diebel, M., Chakravarthi, S., Dunham, S. T., Machala, C. F., Ekbote, S., Jain, A.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12