Blank Cover Image

Persistent Spectral Hole-Burning of CuCl Semiconductor Quantum Dots

Author(s):
Publication title:
Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
405
Pub. Year:
1996
Page(from):
301
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993082 [1558993088]
Language:
English
Call no.:
M23500/405
Type:
Conference Proceedings

Similar Items:

Chen,L., Wang,Y., Pan,Y., Zhao,Y., Li,F., Hu,J., Lu,X., Fu,S.

SPIE-The International Society for Optical Engineering

Masumoto, Yasuaki

Materials Research Society

Tian,M., Lorgere,I., Galaup,J., Le Gouet,J.-P.

SPIE-The International Society for Optical Engineering

Yagyu,E., Yoshimura,M.

SPIE-The International Society for Optical Engineering

Nogami, M.

SPIE-The International Society for Optical Engineering

A. Rosselet, W. Graff, U.P. Wild, C.U. Keller, R. Gschwind

Society of Photo-optical Instrumentation Engineers

Nogami,M., Hayakawa,T., Ishikawa,T., Nagakura,T., Kasuga,T.

SPIE - The International Society for Optical Engineering

Asryan,L.V., Suris,R.A.

SPIE - The International Society for Optical Engineering

Nogami,M.

SPIE - The International Society for Optical Engineering

Uskov, A. V., O'Reilly, E. P., Huyet, G., Melnik, S., O'Brien, D.

SPIE - The International Society of Optical Engineering

Nogami,M., Abe,Y.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12