STRUCTURE, MORPHOLOGY AND EVOLUTION OF INTERFACES IN Si/Si1-xGex SUPERLATTICES
- Author(s):
- Publication title:
- Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 355
- Pub. Year:
- 1995
- Page(from):
- 9
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992566 [1558992561]
- Language:
- English
- Call no.:
- M23500/355
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
7
Conference Proceedings
Fabrication and Structural and Optical Properties of Amorphous Si/SiO2 Superlattices on (100) Si
MRS - Materials Research Society |
2
Conference Proceedings
INTERFACE STRUCTURE OF Ge/Si SUPERLATTICES DETERMINED BY X-RAY ABSORPTION FINE STRUCTURE
Materials Research Society |
8
Conference Proceedings
Raman Scattering from Phonons in Quasiperiodic Superlattices Based on Generalizations of the Fibonacci Sequence
Plenum Press |
Materials Research Society |
9
Conference Proceedings
Index of Refraction and Strain-Induced Birefringence of Pseudomorphic Si1-xGex
MRS - Materials Research Society |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
Electrochemical Society |
11
Conference Proceedings
*Optical and microstructural characterization of nanocrystalline silicon superlattices
MRS-Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |