Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

Author(s):

Lai,T. ( Zhongshan Univ. )
Lin,W.

Publication title:

Practical Holography XI and Holographic Materials III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3011

Pub. Year:

1997

Vol.:

PartA

Page(from):

156

Page(to):

164

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424228 [0819424226]

Language:

English

Call no.:

P63600/3011

Type:

Conference Proceedings

Details

TDL ID:	ZA00016569
Series ID:	PA00000029
Conf. info. (Name):	Practical Holography ; Holographic Materials
Conf. info. (Number):	1997 : 11th ; 3rd
Conf. info. (Venue):	San Jose, CA
Conf. info. (Date):	1997.02.10-1997.02.11

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