Measuring thermal conductivity and diffusivity by holographic interferometry

Measuring thermal conductivity and diffusivity by holographic interferometry

Author(s):

Leung,K.M. ( City Univ.of Hong Kong )
Liu,B.C.
Lee,S.T.
Cheung,A.C.
Lam,Y.W.

Publication title:

International Conference on Experimental Mechanics: Advances and Applications, 4-6 December, 1996, Singapore

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2921

Pub. Year:

1997

Page(from):

120

Page(to):

125

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819423238 [0819423238]

Language:

English

Call no.:

P63600/2921

Type:

Conference Proceedings

Details

TDL ID:	ZA00016560
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Experimental Mechanics
Conf. info. (Number):	1996
Conf. info. (Venue):	Singapore
Conf. info. (Date):	1996.12.04-1996.12.06

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