Blank Cover Image

Infrared interferometer for optical testing

Author(s):
Publication title:
Laser interferometry VIII--techniques and analysis : 6-7 August, 1996, Denver Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2860
Pub. Year:
1996
Page(from):
217
Page(to):
224
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422484 [0819422487]
Language:
English
Call no.:
P63600/2860
Type:
Conference Proceedings

Similar Items:

Freischlad,K.R.

SPIE-The International Society for Optical Engineering

Rice, J.P., Lykke, K.R., Yoon, H.W.

SPIE-The International Society for Optical Engineering

Freischlad, K.R., Eng, R., Hadasway, J.B.

SPIE-The International Society for Optical Engineering

Lee, C.L., Lesyna, L., Lorell, K.R., Aubrun, J., Champagne, P., Didriksen, N., Nikolaskin, V., Mihara, R., Clappier, …

SPIE-The International Society for Optical Engineering

K.R. Freischlad, C. Huang

Society of Photo-optical Instrumentation Engineers

9 Conference Proceedings Optical detection of DNA damage

Rogers,K.R., Apostol,A., Cembrano,J.

SPIE - The International Society for Optical Engineering

4 Conference Proceedings Large flat panel profiler

Freischlad,K.R.

SPIE-The International Society for Optical Engineering

K. Kråkenes, K. Bløtekjær

Society of Photo-optical Instrumentation Engineers

Sato,K., Nishikawa,J., Yoshizawa,M., Fukushima,T., Machida,Y., Honma,Y., Kuwabara,R., Suzuki,S., Torii,Y., Kudo,K., …

SPIE-The International Society for Optical Engineering

J. Schubert, D. Lemke, W. Krätschmer, K. Mampel

Society of Photo-optical Instrumentation Engineers

Sanders,J.S., Roland,R., Cosby,D.S., Saylor,D.A., Harrison,K.R.

SPIE - The International Society for Optical Engineering

S. Tang, R. E. Bills, K. Freischlad

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12