Photoreflectance spectroscopy for semiconductor structure investigations
- Author(s):
- Misiewicz,J. ( Technical Univ.of Wroclaw )
- Publication title:
- Metal/Nonmetal Microsystems: Physics, Technology, and Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2780
- Pub. Year:
- 1996
- Page(from):
- 141
- Page(to):
- 148
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421661 [0819421669]
- Language:
- English
- Call no.:
- P63600/2780
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Partially strained Si1-xGex/Si structures investigated by photoreflectance spectroscopy
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
4
Conference Proceedings
Photoreflectance spectroscopy of metalorganic chemical vapor deposition (MOCVD)-grown GaAs and GaAs/GaAlAs structures
Society of Photo-optical Instrumentation Engineers |
10
Conference Proceedings
Modulation spectroscopy characterization of InAs/GaInAsP/InP quantum dash laser structures
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Photoreflectance investigations of AlxGa1-xAs/GaAs bandgap dependence on Al content
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Simulation of photomodulation effects on semiconductor interfaces and metal-semiconductor contacts for photoreflectance spectroscopy
Society of Photo-optical Instrumentation Engineers |
6
Conference Proceedings
2D hole gas in GaAs/(AIGs)As heterostructures investigated by photoreflectance apectroscopy
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Total photoluminescence spectroscopy of GaN nasnocrystals doped by Eu3+ ions [6321-26]
SPIE - The International Society of Optical Engineering |