Experimental results from 32｡ﾟ32 CMOS photogate and photodiode active pixel image sensors

Experimental results from 32｡ﾟ32 CMOS photogate and photodiode active pixel image sensors

Author(s):

Solhusvik,J. ( Ecole Nationale Superieure de l'Aeronautique et de l'Espace )
Cavadore,C.
Farre,J.A.

Publication title:

Photonic Component Engineering and Applications

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2749

Pub. Year:

1996

Page(from):

101

Page(to):

111

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421302 [0819421308]

Language:

English

Call no.:

P63600/2749

Type:

Conference Proceedings

Details

TDL ID:	ZA00016543
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Photonic Component Engineering and Applications
Conf. info. (Number):	1996
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1996.04.08-1996.04.09

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