In-situ damage monitoring of composite structures

In-situ damage monitoring of composite structures

Author(s):

Neary,T.E. ( IBM Microelectronics Div. )
Huston,D.R.
Wu,J.
Spillman,W.B.,Jr.

Publication title:

Smart structures and materials 1996 : Smart sensing, processing and instrumentation : 26-28 February 1996, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2718

Pub. Year:

1996

Vol.:

PartA

Page(from):

202

Page(to):

217

Pub. info.:

Bellingham: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420930 [081942093X]

Language:

English

Call no.:

P63600/2718

Type:

Conference Proceedings

Details

TDL ID:	ZA00016540
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	1996
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1996.02.26-1996.02.28

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