Image sensing method and defect detection algorithm for a 256-Mb and 1-Gb DRAM mask inspection system

Image sensing method and defect detection algorithm for a 256-Mb and 1-Gb DRAM mask inspection system

Author(s):

Inoue,H. ( Toshiba Corp.(Japan) )
Okuda,K. ( Toshiba Corp.(Japan) )
Nomura,T. ( Toshiba Corp.(Japan) )
Tsuchiya,H. ( Toshiba Corp.(Japan) )
Tabata,M. ( Toshiba Corp.(Japan) )

Publication title:

Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3096

Pub. Year:

1997

Page(from):

462

Page(to):

469

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425164 [0819425168]

Language:

English

Call no.:

P63600/3096

Type:

Conference Proceedings

Details

TDL ID:	ZA00016472
Series ID:	PA00000029
Conf. info. (Name):	Photomask and Next Generation Lithography Mask Technology : Photomask and X-Ray Mask Technology
Conf. info. (Number):	1997 : 4th
Conf. info. (Venue):	Kawasaki, Japan
Conf. info. (Date):	1997.04.17-1997.04.18

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