XUV laser grid image refractometry applied in laser hole-boring experiments

XUV laser grid image refractometry applied in laser hole-boring experiments

Author(s):

Takahashi,K. ( Osaka Univ.(Japan) )

Kodama,R. ( Osaka Univ.(Japan) )

Tanaka,K.A. ( Osaka Univ.(Japan) )

Hashimoto,H. ( Osaka Univ.(Japan) )

Kato,Y. ( Osaka Univ.(Japan) )

Mima,K. ( Osaka Univ.(Japan) )

Murai,K. ( Osaka National Research Institute (Japan) )

Weber,F.A. ( Lawrence Livermore National Lab. )

Barbee,T.W.,Jr. ( Lawrence Livermore National Lab. )

Celliers,P.M. ( Lawrence Livermore National Lab. )

Da Silva,L.B. ( Lawrence Livermore National Lab. )

6 more

Publication title:

Soft X-ray lasers and applications II : 28-29 July, 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3156

Pub. Year:

1997

Page(from):

146

Page(to):

153

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425782 [0819425788]

Language:

English

Call no.:

P63600/3156

Type:

Conference Proceedings

Details

TDL ID:	ZA00016466
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Soft X-Ray Lasers and Applications
Conf. info. (Number):	1997 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.28-1997.07.29

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