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Failure rate estimation in the case of zero failures

Author(s):
Meade,D.J. ( Advanced Micro Devices,Inc. )  
Publication title:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3216
Pub. Year:
1997
Page(from):
179
Page(to):
185
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426482 [0819426482]
Language:
English
Call no.:
P63600/3216
Type:
Conference Proceedings

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