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Ionization coefficient measurements in InP by using multiplication noise characteristics of InP/InGaAs separate absorption,grading,charge,and multiplication (SAGCM) avalanche photodiodes (APDs)

Author(s):
  • An,S. ( Nortel Technology Ltd. (Canada) and Simon Fraser Univ.(Canada) )
  • Clark,W.R. ( Nortel Technology Ltd. (Canada) )
  • Deen,M.J. ( Simon Fraser Univ.(Canada) )
  • Vetter,A.S. ( Nortel Technology Ltd. (Canada) )
  • Svilans,M. ( Nortel Technology Ltd. (Canada) )
Publication title:
Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3287
Pub. Year:
1998
Page(from):
48
Page(to):
59
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427267 [0819427268]
Language:
English
Call no.:
P63600/3287
Type:
Conference Proceedings

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