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Micro-Raman characterization of GaN epilayers (Invited Paper)

Author(s):
Publication title:
International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3359
Pub. date:
1998
Page(from):
310
Page(to):
316
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428080 [0819428086]
Language:
English
Call no.:
P63600/3359
Type:
Conference Proceedings

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