Micro-Raman characterization of GaN epilayers (Invited Paper)
- Author(s):
- Renucci,M.A. ( Univ.Paul Sabatier (France) )
- Demangeot,F. ( Univ.Paul Sabatier (France) )
- Frandon,J. ( Univ.Paul Sabatier (France) )
- Publication title:
- International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3359
- Pub. Year:
- 1998
- Page(from):
- 310
- Page(to):
- 316
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428080 [0819428086]
- Language:
- English
- Call no.:
- P63600/3359
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
7
Conference Proceedings
Growth and characterization of AIGaN/GaN epitaxial layers by MOCVD on SiC substrates for RF device applications (Invited Paper) [6121-13]
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
8
Conference Proceedings
Characterization of GaN epitaxial films grown on SiNx and TiNx porous network templates (Invited Paper) [6121-11]
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
MRS-Materials Research Society |
MRS - Materials Research Society |
10
Conference Proceedings
Micro-optics: manufacturing and characterization (Invited Paper) [5965-01]
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
Materials Research Society |