1.

国際会議録
国際会議録
1. X-ray analysis of stress distribution in ferrite and austenite of duplex steel during tensile loading
Monin, V.I. ; de Assis, J.T. ; Filippov, S.A. ; Gurova, T. ; Teodosio, J.R. ; Abreu, H.F.
出版情報: Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 9-15 June 2003, St. Petersburg, Russia.  pp.209-211,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5400
2.

国際会議録
国際会議録
2. Portable x-ray apparatus for stress measurements
Monin, V.I. ; de Assis, J.T. ; Pereira, F.R. ; Filippov, S.A. ; Gurova, T. ; Teodosio, J.R. ; Abreu, H.F.
出版情報: Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 9-15 June 2003, St. Petersburg, Russia.  pp.192-195,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5400
3.

国際会議録
国際会議録
3. Study of stress gradients using computer simulation of diffraction data
de Assis, J.T. ; Monin, V.I. ; Filippov, S.A. ; Merendaz, A.
出版情報: Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 9-15 June 2003, St. Petersburg, Russia.  pp.196-199,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5400
4.

国際会議録
国際会議録
4. Computed topography with a low-intensity proton flux: results of a Monte Carlo simulation study
Schulte, R.W. ; Klock, M.C.L ; Bashkirov, V. ; Evseev, I.G. ; de Assis, J.T. ; Yevseyeva, O. ; Lopes, R.T. ; Li, T. ; Williams, D.C. ; Wroe, A.J. ; Schelin, H.R.
出版情報: Penetrating Radiation Systems and Applications VI.  pp.153-164,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5541