Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596328-596328, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.596410-596410, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.596411-596413, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Sun, Z. ; Xu, Z. Y. ; Yang, X. D. ; Sun, B. Q. ; Ji, Y. ; Zhang, S. Y. ; Ni, H. Q. ; Niu, Z. C.
出版情報:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials X. pp.61180Z-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering