Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.56-65, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fu, R. ; Chang, B. ; Qian, Y. ; Zhan, Q. ; Qiu, Y.
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Optical design and testing II : 8-12 November 2004, Beijing, China. pp.621-630, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Chang, B. ; Fu, R. ; Zong, Z. ; Qian, Y. ; Zhan, Q. ; Gao, P. ; Du, X. ; Liu, L.
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Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA. pp.33-40, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA. pp.83-89, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.85-92, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.179-185, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
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Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.256-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering