Image and signal processing for remote sensing VI : 27-29 September 2000, Barcelona, Spain. pp.272-279, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.32-38, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Workshop on Photonics and Imaging in Biology and Medicine : 8-10 October 2001, Wuhan, China. pp.177-181, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.62-66, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA. pp.12-21, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of artificial neural networks in image processing II : 12-13 February, 1997, San Jose, California. pp.36-41, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China. pp.164-168, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China. pp.176-178, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California. Part 1 pp.228-235, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering