1.

国際会議録
国際会議録
1. 1.55-ｦﾌm Er-doped GaN LED
Shen,H. ; Pamulapati,J. ; Taysing,M. ; Wood,M.C. ; Lareau,R.T. ; Ervin,M.H. ; Mackenzie,J.D. ; Ren,F. ; Abernathy,C.R. ; Zavada,J.M.
出版情報: Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California.  pp.107-111,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3622
2.

国際会議録
国際会議録
2. AIN Deposited by OMVPE and PLD Used as an Encapsulate for Ion Implanted SiC
Jones,K.A. ; Xie,K. ; Eckart,D.W. ; Wood,M.C. ; Talyansky,V. ; Vispute,R.D. ; Venkatesan,T. ; Wongchotigul,K. ; Spencer,M.G.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1243-1246,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
3.

国際会議録
国際会議録
3. Measurement of carrier transport and dynamics in wide bandgap semiconductors using femtosecond pump-probe techniques
Wraback,M. ; Shen,H. ; Wood,M.C. ; Carrano,J.C. ; Collins,C.J. ; Li,T. ; Campbell,J.C. ; Eiting,C.J. ; Lambert,D.J.H. ; Chowdhury,U. ; Wong,M.M. ; Dupuis,R.D. ; Schurman,M.J. ; Ferguson,I.A.
出版情報: Ultrafast Phenomena in Semiconductors V.  pp.36-44,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4280
4.

国際会議録
国際会議録
4. Pulsed laser deposition of TiN,AIN,and GaN films on sapphire
Talyansky,V. ; Vispute,R.D. ; Stanton,M. ; Downes,M. ; Chupoon,S. ; Sharma,R.P. ; Venkatesan,T. ; Li,Y.X. ; Salamanca-Riba,L. ; Wood,M.C. ; Jones,K.A.
出版情報: International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '96.  pp.27-31,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3211