1.

国際会議録
国際会議録
1. RBS ANALYSIS OF INTERMIXING IN ANNEALED SAMPLES OF Pt/Ti/III-V SEHICONDUCTORS
Savin, W. ; Weir, B. E. ; Katz, A. ; Chu, S. N. G. ; Nakahara, S. ; Harris, D. W.
出版情報: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.227-232,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 181
2.

国際会議録
国際会議録
2. 1/f Noise in the Tunneling Current of Thin Gate Oxides
Alers, G. B. ; Monroe, D. ; Krisch, K. S. ; Weir, B. E. ; Chang, A. M.
出版情報: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.311-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 428
3.

国際会議録
国際会議録
3. Soft Breakdown in Ultrathin Oxides
Weir, B. E. ; Silverman, P. J. ; Alers, G. B. ; Monroe, D. ; Alam, M. A. ; Sorsch, T. W. ; Green, M. L. ; Timp, G. L. ; Ma, Y. ; Frei, M. ; Liu, C. T. ; Bude, J. D. ; Krisch, K. S.
出版情報: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.301-,  1999.  Warrendale, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 567
4.

国際会議録
国際会議録
4. Relationship Between Interfacial Roughness and Dielectric Reliability for Silicon Oxynitride Gate Dielectrics Processed With Nitric Oxide
Sapjeta, J. ; Green, M. L. ; Chang, J. P. ; Silverman, P. J. ; Sorsch, T. W. ; Weir, B. E. ; Gladden, W. ; Ma, Y. ; Sung, C. Y. ; Lennard, W. N.
出版情報: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.289-,  1999.  Warrendale, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 567
5.

国際会議録
国際会議録
5. PROCESS DESIGN FOR NON-ALLOYED CONTACTS TO InP-BASED LASER DEVICES
Katz, A. ; Dautremont-Smith, W. C. ; Chu, S. N. G. ; Pearton, S. J. ; Geva, M. ; Weir, B. E. ; Thomas, P. M. ; Kimerling, L. C.
出版情報: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.401-410,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 181
6.

国際会議録
国際会議録
6. Minimization of Interfacial Microroughness for 13-60 ｢？Ultrathin Gate Oxides
Sapjeta, J. ; Boone, T. ; Rosamilia, J. M. ; Silverman, P. J. ; Sorsch, T. W. ; Timp, G. ; Weir, B. E.
出版情報: Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A..  pp.203-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 477