1.

国際会議録
国際会議録
1. Capturing the sampling effects: a TOD sensor performance model
Hogervorst,M.A. ; Bijl,P. ; Valeton,J.M.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA.  pp.62-73,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4372
2.

国際会議録
国際会議録
2. TOD test method for characterizing electro-optical system performance
McHugh,S.W. ; Irwin,A. ; Valeton,J.M. ; Bijl,P.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA.  pp.39-45,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4372
3.

国際会議録
国際会議録
3. Critical evaluation of test patterns for EO system performance characterization
Bijl,P. ; Valeton,J.M. ; Hogervorst,M.A.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA.  pp.27-38,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4372
4.

国際会議録
国際会議録
4. Quantifying target distinctness through visual conspicuity
Toet,A. ; Bijl,P. ; Kooi,F.L. ; Valeton,J.M.
出版情報: Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida.  pp.152-163,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3375
5.

国際会議録
国際会議録
5. TOD:a new method to characterize electro-optical system performance
Bijl,P. ; Valeton,J.M.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, USA.  pp.182-193,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3377
6.

国際会議録
国際会議録
6. Automatic characterization of electro-optical sensors with image processing using the triangle orientation discrimination(TOD)method
Lange,D.-J.J.de ; Valeton,J.M. ; Bijl,P.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA.  pp.104-111,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4030
7.

国際会議録
国際会議録
7. TOD predicts target acquisition performance for staring and scanning thermal imagers
Bijl,P. ; Valeton,J.M. ; Jong,A.N.de
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA.  pp.96-103,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4030
8.

国際会議録
国際会議録
8. T-CAT:a new thermal camera acuity tester
Valeton,J.M. ; Bijl,P. ; Agterhuis,E. ; Kriekaard,S.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA.  pp.232-238,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4030
9.

国際会議録
国際会議録
9. Test of three visual search and detection models
Toet,A. ; Bijl,P. ; Valeton,J.M.
出版情報: Targets and backgrounds : characterization and representation V : 5-7 April 1999, Orlando, Florida.  pp.323-334,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3699
10.

国際会議録
国際会議録
10. Guidelines for accurate TOD measurement
Bijl,P. ; Valeton,J.M.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing X : 7-8 April 1999, Orlando, Florida.  pp.14-25,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3701