Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing of the marine environment : 15-17 November 2006, Goa, India. pp.64061G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Androulakis, J. ; Pcionek, R. ; Quarez E. ; Palchik, O. ; Kong, H. ; Uher, C. ; Dangelo, J.J. ; Hogan, T. ; Tang, X. ; Tritt, T. ; Kanatzidis, Mercouri G.
出版情報:
Materials and technologies for direct thermal-to-electric energy conversion : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A.. pp.187-194, 2006. Warrendale, Pa.. Materials Research Society
Tang, X. ; Hsieh, J. ; Nilsen, R. A. ; Mcolash, S. M.
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Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.642-646, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.264-269, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA. pp.774-781, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Li, Y. ; Tang, X. ; Miranda, J. ; Sue, H. -J. ; Whitcomb, J. ; Bradley, W.
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ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia. 3 pp.3423-3427, 1999. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
シリーズ名:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Li, Y. ; Tang, X. ; Miranda, J. ; Sue, H. -J. ; Whitcomb, J. ; Bradley, W.
出版情報:
ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia. 2 pp.3423-3427, 1999. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
シリーズ名:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.259-263, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering