1.

国際会議録
国際会議録
1. Electromigration-Induced Plastic Deformation in Cu Damascene Interconnect Lines as Revealed by Synchrotron X-Ray Microdiffraction
Budiman, Arief S. ; Tamura, N. ; Valek, B.C. ; Gadre, k. ; Maiz, J. ; Spolenak, R. ; Patel, J.R. ; Nix, W.D.
出版情報: Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A..  pp.295-304,  2006.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 914
2.

国際会議録
国際会議録
2. Strains, Stresses and Elastic Properties in Polycrystalline Metallic Thin Films: In Situ Deformation Combined with X-Ray Diffraction and Simulation Experiments
Goudeau, P. ; Faurie, D. ; Girault, B. ; Renault, P.O. ; Le Bourhis, E. ; Villain, P. ; Badawi, F. ; Castelnau, O. ; Brenner, R. ; Bechade, J.L. ; Geandier, G. ; Tamura, N.
出版情報: Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006.  pp.735-742,  2006.  Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 524-525
3.

国際会議録
国際会議録
3. Application of the White/Monochromatic X-Ray μ-Diffraction Technique to the Study of Texture and Triaxial Strain at the Sub-Micron Level
Goudeau, P. ; Tamura, N. ; Spolenak, R. ; Padmore, H. A.
出版情報: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.672-677,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 490-491
4.

国際会議録
国際会議録
4. Chemical Structures of Oxynitride/Si(100) Interface
Takahashi, K. ; Nohira, H. ; Kato, H. ; Tamura, N. ; Hikazutani, K. ; Sano, S. ; Hattori, T.
出版情報: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.181-186,  2000.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2000-2
5.

国際会議録
国際会議録
5. A connectorized fiber downlink for FMOS
Murray, G.J. ; Luke, P. ; Robertson, D.J. ; Tamura, N.
出版情報: Fiber-based component fabrication, testing and connectorization : 29-30 October 2002, Brugge, Belgium.  pp.184-194,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4943
6.

国際会議録
国際会議録
6. Multiscale Study of Internal Stress and Texture in Ferroelectrics
Ustundag, E. ; Rogan, R. C. ; Daymond, M. R. ; Tamura, N. ; Margulies, L. ; Poulsen, H.
出版情報: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.28-28,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 490-491
7.

国際会議録
国際会議録
7. Surface and Interface Structures of Ultrathin Silicon Oxynitride Films
Takahashi, K. ; Inoue, K. ; Kato, H. ; Tamura, N. ; Hikazutani, K. ; Sano, S. ; Hattori, T.
出版情報: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology.  pp.225-231,  2001.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2001-17
8.

国際会議録
国際会議録
8. White Beam Microdiffraction Experiments for the Determination of the Local Plastic Behaviour of Polycrystals
Castelnau, O. ; Goudeau, P. ; Geandier, G. ; Tamura, N. ; Bechade, J.L. ; Bornert, M. ; Caldemaison, D.
出版情報: Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006.  pp.103-108,  2006.  Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 524-525
9.

国際会議録
国際会議録
9. 3-D measurement of deformation microstructure in Al(0.2%)Mg using submicron resolution white X-ray microbeams
Larson, B. C. ; Tamura, N. ; Chung, J-S. ; Ice, G. E. ; Budai, J. D. ; Tischler, J. Z. ; Yang, W. ; Weiland, H. ; Lowe, W. P.
出版情報: Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.247-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 590
10.

国際会議録
国際会議録
10. Strain and Texture in Al-Interconnect Wires Measured by X-ray Microbeam Diffraction
Tamura, N. ; Chung, J-S. ; Ice, G. E. ; Larson, B. C. ; Budai, J. D. ; Tischler, J. Z. ; Yoon, M. ; Williams, E. L. ; Lowe, W. P.
出版情報: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.175-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 563