1.

国際会議録
国際会議録
1. Nonlinear features for improved pattern recognition
Casasent,D.P. ; Talukder,A.
出版情報: Optical processing and computing : a tribute to Adolf Lohmann : 17-18 April 2001, Orlando, USA.  pp.128-136,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4392
2.

国際会議録
国際会議録
2. Classification and pose estimation of objects using nonlinear features
Talukder,A. ; Casasent,D.P.
出版情報: Applications and science of computational intelligence : 13-16 April 1998, Orlando, Florida.  pp.12-23,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3390
3.

国際会議録
国際会議録
3. New nonlinear features for inspection,robotics,and face recognition
Casasent,D.P. ; Talukder,A.
出版情報: Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado.  pp.2-12,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3804
4.

国際会議録
国際会議録
4. Face recognition with pose variations
Casasent,D.P. ; Talukder,A.
出版情報: Intelligent robots and computer vision XIX : algorithms, techniques, and active vision : 7-8 November 2000, Boston, USA.  pp.1-4,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4197
5.

国際会議録
国際会議録
5. Pose estimation and transformation for face recognition
Talukder,A. ; Casasent,D.P.
出版情報: Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida.  pp.11-14,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4043
6.

国際会議録
国際会議録
6. A Modified Analytical Model for Electroluminescence Behaviour in Blue-Emitting Sr:S:Ce ACTFEL Display Devices
Dhillon,T.S. ; Talukder,A. ; McClure,J.C. ; Singh,V.P.
出版情報: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.1134-1137,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3975
7.

国際会議録
国際会議録
7. Automated segmentation and feature extraction of product inspection items
Talukder,A. ; Casasent,D.P.
出版情報: Optical pattern recognition VIII : 22-23 April, 1997, Orlando, Florida.  pp.96-107,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3073
8.

国際会議録
国際会議録
8. Joint recognition and discrimination in nonlinear feature space (Invited Paper)
Talukder,A. ; Casasent,D.P.
出版情報: Intelligent robots and computer vision XVI : Algorithms, techniques, active vision, and materials handling : 15-17 October 1997 Pittsburgh, Pennsylvania.  pp.12-23,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3208
9.

国際会議録
国際会議録
9. Real-time robust line detection in microscopy images
Talukder,A. ; Casasent,D.P.
出版情報: Intelligent robots and computer vision XVI : Algorithms, techniques, active vision, and materials handling : 15-17 October 1997 Pittsburgh, Pennsylvania.  pp.495-503,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3208
10.

国際会議録
国際会議録
10. Feature space trajectory neural net classifier:confidences and thresholds for clutter and low-contrast objects
Neiberg,L. ; Casasent,D.P. ; Talukder,A.
出版情報: Applications and science of artificial neural networks II : 9-12 April, 1996, Orlando, Florida.  pp.435-446,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2760