1.

国際会議録
国際会議録
1. Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature
S. Tanimoto ; T. Suzuki ; A. Hanamura ; M. Hoshi ; T. Shinohara ; K. Arai
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.779-782,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557
2.

国際会議録
国際会議録
2. Simulation of Solution Chemistry in Crevice Corrosion for Stainless Steel
T. Shinohara ; Y. Fukaya ; A. Tahara ; Y. Hosoya
出版情報: High Resolution Characterization of Corrosion Processes.  pp.45-56,  2008.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 11(22)
3.

国際会議録
国際会議録
3. Radiographic and Tomographic Neutron Bragg Imaging for Quantitative Visualization of Wide Area Crystalline Structural Information
H. Sato ; Y. Shiota ; Y. Todaka ; T. Shinohara ; T. Kamiyama
出版情報: THERMEC 2013 : Selected, peer reviewed papers from the 8th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS Processing, Fabrication, Properties, Applications, December 2-6, 2013, Las Vegas, USA.  pp.2109-2114,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 783-786
4.

国際会議録
国際会議録
4. Effect of Electrode Potential on Solution Chemistry Inside a Crevice
T. Shinohara ; Y. Fukaya
出版情報: Corrosion and electrochemistry of advanced materials, in Honor of Koji Hashimoto.  pp.425-436,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 1(4)