1.

国際会議録
国際会議録
1. STRAIN RELAXATION IN EPITAXIAL HETEROSTRUCTURES: SENSITIVITY OF HIGH RESOLUTION X-RAY DIFFRACTION
Goorsky, M.S. ; Horng, S.T. ; Stiffler, S.R. ; Stanis, C.S.
出版情報: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.415-420,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 280
2.

国際会議録
国際会議録
2. THE HIGH TEMPERATURE STABILITY AND RELAXATION OF UHV/CVD SiGe THIN FILMS
Stiffler, S.R. ; Stanis, C.L. ; Goorsky, M.S. ; Chan, K.K.
出版情報: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.471-474,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 280