1.

国際会議録
国際会議録
1. Minimum Ionizing Particle Detector Based on p+n Junction SiC Diode
Moscatelli, F. ; Scorzoni, A. ; Poggi, A. ; Bruzzi, M. ; Lagomarsino, S. ; Sciortino, S. ; Wagner, G. ; Niptoi, R.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1469-1472,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Ni-Silicide Contacts to 6H-SiC: Contact Resistivity and Barrier Height on Ion Implanted n-Type and Barrier Height on p-Type Epilayer
Moscatelli, F. ; Scorzoni, A. ; Poggi, A. ; Canino, M. ; Nipoti, R.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.737-740,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
3.

国際会議録
国際会議録
3. Measurements of Charge Collection Efficiency of p+/n Junction SiC Detectors
Moscatelli, F. ; Scorzoni, A. ; Poggi, A. ; Bruzzi, M. ; Lagomarsino, S. ; Mersi, S. ; Sciortino, S. ; Lazar, M. ; Placido, A. Di ; Nipoti, R.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.1021-1024,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
4.

国際会議録
国際会議録
4. THE EVALUATION OF THE TRUE TEST TEMPERATURE DURING WAFER-LEVEL ELECTROMIGRATION TESTS
Baldini, G. L. ; Scorzoni, A. ; Tamarri, F. ; Trombetti, D.
出版情報: Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.289-294,  1992.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 265
5.

国際会議録
国際会議録
5. Interracial Properties of SiO2 Grown on 4H-SiC: Comparison between N2O and Wet O2 Oxidation Ambient
Poggi, A. ; Moscatelli, F. ; Scorzoni, A. ; Marino, G. ; Nipoti, R. ; Sanmartin, M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.979-982,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
6.

国際会議録
国際会議録
6. The Influence of Thermal-Mechanical Effects on Resistance Changes During and After Electromigration Experiments
Scorzoni, A. ; Munari, I. De ; Stulens, H. ; D'Haeger, V.
出版情報: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.513-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 391
7.

国際会議録
国際会議録
7. Early Detection of the Metallization Quality Using Moderately Accelerated Electromigration Stress Conditions
Scorzoni, A. ; Munari, I. De ; Impronta, M. ; Balboni, R. ; Kelaidis, N. ; Foley, S. ; Forde, M.
出版情報: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.15-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 516
8.

国際会議録
国際会議録
8. ELECTRICAL CHARACTERIZATION OF ION IMPLANTED, THERMALLY ANNEALED TiN FILMS ACTING AS DIFFUSION BARRIERS ON SHALLOW JUNCTION SILICON DEVICES
Armigliato, A. ; Finetti, M. ; Gabilli, E ; Guerri, S. ; Ostoja, P. ; Sabato, G. ; Scorzoni, A.
出版情報: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.183-188,  1985.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 45
9.

国際会議録
国際会議録
9. A Percolative Approach To Electromigration Modelling
Pennetta, C. ; Reggiani, L. ; Trefan, G. ; Fantini, F. ; Scorzoni, A. ; DeMunari, I.
出版情報: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D2.7-,  2001.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 612
10.

国際会議録
国際会議録
10. Comparison between Different Schottky Diode Edge Termination Structures: Simulations and Experimental Results
La Via, F. ; Roccaforte, F. ; Di Franco, S. ; Raineri, V. ; Moscatelli, F. ; Scorzoni, A. ; Cardinali, G.C.
出版情報: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.827-830,  2003.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 433-436