1.

国際会議録
国際会議録
1. Advanced optical metrology aimed at part inspection and reverse engineering for Mems and Nems
Pfeifer, T. ; Schmitt, R. ; Aleriano, U.
出版情報: Smart sensors, actuators, and MEMS II : 9-11 May 2005, Seville, Spain.  pp.587-598,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5836
2.

国際会議録
国際会議録
2. Intercomparison of solar UV direct irradiance spectral measurements at Izana in June 2005 [5886-09]
Bais, A. ; Blumthaler, M. ; Webb, A. ; Seckmeyer, G. ; Thiel, S. ; Kazadzis, S. ; Redondas, A. ; Kift, R. ; Kouremeti, N. ; Schallhart, B. ; Schmitt, R. ; Pissulla, D. ; Diaz, J. P. ; Garcia, O. ; Diaz, Rodriguez, A. M.
出版情報: Ultraviolet ground- and space-based measurements, models, and effects V : 31 July-1 August 2005, San Diego, California, USA.  pp.588609-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5886
3.

国際会議録
国際会議録
3. Physics of high-average-power repetitively pulsed laser ablation of dielectric materials (Invited Paper)
Hugenschmidt, M. ; Schmitt, R. ; Moeglin, J.P. ; Daree, K. ; Borchert, H.
出版情報: High-Power Laser Ablation IV.  Part One  pp.103-114,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4760
4.

国際会議録
国際会議録
4. Combined ultrasound, optoacoustic, and elasticity imaging
Emelianov, S.Y. ; Aglyamov, S.R. ; Shah, J. ; Sethuraman, S. ; Scott, W.G. ; Schmitt, R. ; Motamedi, M. ; Karpiouk, A. ; Oraevsky, A.A.
出版情報: Photons Plus Ultrasound: Imaging and Sensing.  pp.101-112,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5320