Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California. pp.128-137, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.2-16, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Enabling photonic technologies for aerospace applications : 5-6 April 1999, Orlando, Florida. pp.24-30, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of photonic technology 4 : closing the gap between theory, development, and application : Photonics North 2000. pp.254-255, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.426-435, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic integrated circuits IV : 26-27 January 2000, San Jose, California. pp.118-128, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California. pp.107-111, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of photonic technology 3 : closing the gap between theory, development, and application. pp.410-413, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering