1.

国際会議録
国際会議録
1. Effects of a Small Addition of Cu or Ge on the Microstructure and Mechanical Property of an Al-Si Alloy
Nakagawa, K. ; Kanadani, T. ; Nakayama, K. ; Sakakibara, A.
出版情報: Aluminium alloys 2006 : research through innovation and technology : proceedings of the 10th International Conference on Aluminium Alloys, Vancouver, Canada, July 9th-13th, 2006.  pp.425-430,  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 519-521
2.

国際会議録
国際会議録
2. Dynamic Characteristics of 4H-SiC pin Dlode on (000-1)C-Face with Small Forward Degradation
Nakayama, K. ; Sugawara, Y. ; Ishii, R. ; Tsuchida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1359-1362,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. Comparison of Propagation and Nucleation of Basal Plane Dislocations in 4H-SiC(000-1) and (0001) Epitaxy
Tsuchida, H. ; Kamata, I. ; Miyanagi, T. ; Nakamura, T. ; Nakayama, K. ; Ishii, R. ; Sugawara, Y.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.231-234,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
4.

国際会議録
国際会議録
4. Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping
Miyanagi, T. ; Tsuchida, H. ; Kamata, I. ; Nakamura, T. ; Ishii, R. ; Nakayama, K. ; Sugawara, Y.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.375-378,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
5.

国際会議録
国際会議録
5. Investigation of Basal Plane Dislocations in the 4H-SiC Epilayers Grown on {0001} Substrates
Tsuehida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T. ; Izumi, K. ; Nakayama, K. ; Ishii, R. ; Asano, K. ; Sugawara, Y.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.97-100,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
6.

国際会議録
国際会議録
6. The improvement of the 3-D reconstruction uniformity using depth-adaptive regularization in diffuse optical tomography (DOT) [5864-23]
Endoh, R. ; Fujii, M. ; Nakayama, K.
出版情報: Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany.  pp.58640K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5864
7.

国際会議録
国際会議録
7. On-Line Analysis of Stress and Birefringence Development in Simultaneous Biaxial Elongation of Poly(ethylene terephthalate)
Ito, H. ; Suzuki, T. ; Kikutani, T. ; Nakayama, K.
出版情報: ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida.  pp.1715-1719,  2000.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 46
8.

国際会議録
国際会議録
8. OPTIMIZATION OF RIB DESIGN AND POSSIBILITIES OF WEIGHT REDUCTION FOR ABS MOLDINGS
Nakayama, K. ; Kodama, M. ; Yamo, M.
出版情報: Conference Proceedings : Plastics-Engineering Toda for Tommorow's World : ANTEC '83, Annual Technical Conference, 41, Hyatt Regency in Chicago,1983.5.2-5.  pp.690-693,  1983.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 29
9.

国際会議録
国際会議録
9. Stress Distribution in 2in SiC Wafer Measured by Photoelastic Method
Sasaki, M. ; Miyanagi, Y. ; Nakayama, K. ; Shiomi, H. ; Nishino, S.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.403-406,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
10.

国際会議録
国際会議録
10. 8.3 kV 4H-SiC PiN Diode on (0001) C-Face with Small Forward Voltage Degradation
Nakayama, K. ; Sugawara, Y. ; Tsuchida, H. ; Miyanagi, T. ; Kamata, I. ; Nakamura, T. ; Asano, K. ; Ishii, R.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.969-972,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485