1.

国際会議録
国際会議録
1. DEFECT ANNIHILATION IN CZOCHRALSKI-GROWN SILICON DURING OUT-DIFFUSION PROCESS PROBED WITH VARIABLE-ENERGY POSITRON BEAM
Kitano, T. ; Wei, L. ; Tabuki, Y. ; Tanigawa, S. ; Mikoshiba, H.
出版情報: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.707-712,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 262
2.

国際会議録
国際会議録
2. Progress in organic write-once technology for Blu-ray disc-recordable and DVD-R media (Invited Paper)
Kubo, H. ; Shibata, M. ; Katayama, K. ; Takano, H. ; Kakuta, T. ; Usami, Y. ; Watanabe, T. ; Nagaoka, K. ; Mikoshiba, H.
出版情報: Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA.  pp.128-135,  2004.  Bellingham.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5380