Michalkiewicz, A. ; Kujawinska, M. ; Krezel, J. ; Salbut, L. ; Wang, X. ; Bos, P. J.
出版情報:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.144-152, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II. pp.467-474, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Michalkiewicz, A. ; Kujawinska, M. ; Marc, P. ; Military Univ. of Technology (Poland)
出版情報:
Optical Micro- and Nanometrology in Microsystems Technology. pp.618806-618806, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering