Mayo, S. ; Miller, P. ; Wilkins, S. W. ; Gao, D. ; Gureyev, T.
出版情報:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63181E-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.297-308, 1985. Pittsburgh, Pa.. Materials Research Society
Roitman, P. ; Mayo, S. ; Simons, D. ; Krause, S.J. ; Venables, D. ; Park, J.C. ; Lee, J.D. ; Lenahan, P. ; Conley, J.
出版情報:
Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices. pp.92-97, 1994. Pennington, NJ. Electrochemical Society
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