1.

国際会議録
国際会議録
1. Laser patterning of thin films of TiNiPd deposited on silicon substrate
Mathe, V.K. ; Sood, D.K. ; Hayes, J.P.
出版情報: Device and process technologies for MEMS, microelectronics, and photonics III : 10-12 December 2003, Perth, Australia.  pp.36-46,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5276
2.

国際会議録
国際会議録
2. Patterning of thin films of TiNi deposited on silicon substrate
Mathe, V.K. ; Sood, D.K. ; Hayes, J.P.
出版情報: Nano- and Microtechnology: Materials, Processes, Packaging, and Systems.  pp.135-145,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4936
3.

国際会議録
国際会議録
3. Characterization of TiNi, TiNiPd thin films by ion beam analysis techniques
Mathe, V.K. ; Sood, D.K. ; Dytlewski, N. ; Evans, P.J.
出版情報: Nano- and Microtechnology: Materials, Processes, Packaging, and Systems.  pp.403-413,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4936