1.

国際会議録
国際会議録
1. Large-area silicon immersion echelle gratings and grisms for IR spectroscopy
Keller,L.D. ; Jaffe,D.T. ; Ershov,O.A. ; Marsh,J.
出版情報: Optical spectroscopic techniques, remote sensing, and instrumentation for atmospheric and space research IV : 30 July-2 August 2001, San Diego, USA.  pp.385-392,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4485
2.

国際会議録
国際会議録
2. New ESCAP-type resist with enhanced etch resistance and its application to future DRAM and logic devices
Conley,W. ; Brunsvold,W.R. ; Buehrer,F. ; Dellaguardia,R. ; Dobuzinsky,D. ; Farrell,T.R. ; Ho,H. ; Katnani,A.D. ; Keller,R. ; Marsh,J. ; Muller,P. ; Nunes,R. ; Ng,H.Y. ; Oberschmidt,J.M. ; Ryan,D. ; Cotler-Wagner,T. ; Schulz,R. ; Ito,H. ; Hofer,D.C.
出版情報: Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California.  pp.282-299,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3049
3.

国際会議録
国際会議録
3. TM-66 swiFFT DSP chip:architecture,algorithms,and applications
Marsh,J. ; McCaskill,J.
出版情報: Digital signal processing technology : 10-11 April 1996, Orlando, Florida.  pp.24-34,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2750