1.

国際会議録
国際会議録
1. Study on The Characteristic of New Type Screw Element in Co-Rotating Twin Screw Extruders (443)
Geng,X. ; Jin,Y. ; Ma,X. ; Zhu,L. ; Li,Z.
出版情報: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  3  pp.3716-3720,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 60
2.

国際会議録
国際会議録
2. High-efficiency low-vertical-divergence-angle 980-nm Al-free active region lasers with novel large optical cavity and asymmetrical cladding layers
Xu,Z. ; Zhang,J. ; Ma,X. ; Yang,G. ; Shen,C. ; Chen,L.
出版情報: In-plane semiconductor lasers IV : 24-25 January 2000, San Jose, California.  pp.66-69,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3947
3.

国際会議録
国際会議録
3. Automation of temperature measurement by laser
Fei,Y. ; Xi,Y. ; Chen,Y. ; Ma,X. ; Shen,Y.
出版情報: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.87-92,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3558
4.

国際会議録
国際会議録
4. Thermal treatments of CdTe and CdZnTe detectors
Chattopadhyay,K. ; Ma,X. ; Ndap,J.-O. ; Burger,A. ; Schlesinger,T.E. ; Greaves,C.M. ; Glass,H.L. ; Flint,J.P. ; James,R.B.
出版情報: Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA.  pp.303-308,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4141
5.

国際会議録
国際会議録
5. Blind channel identification using lower-order statistics
Ma,X. ; Nikias,C.L.
出版情報: Coding and signal processing for information storage : 23-24 October, 1995, Philadelphia, Pennsylvania.  pp.220-231,  1995.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2605
6.

国際会議録
国際会議録
6. Realizing intracavity frequency doubling and Q switching by KTP
Huo,Y. ; Chen,F. ; He,S. ; Shen,D. ; Ma,X. ; Lu,Y.
出版情報: Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China.  pp.31-36,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3556
7.

国際会議録
国際会議録
7. Experimental study of a fiber optical gyro utilizing a ring resonator and a low-coherence length light source
Hu,Z. ; Ma,X. ; Li,F. ; Tang,Q. ; Zhou,S. ; Wu,Y.
出版情報: Fiber optic sensor technology and applications : 20-22 September 1999, Boston, Massachusetts.  pp.348-355,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3860
8.

国際会議録
国際会議録
8. Lithography and line-edge roughness of high-activation-energy resists
Masuda,S. ; Ma,X. ; Noya,G. ; Pawlowski,G.
出版情報: Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA.  Part1  pp.252-263,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3999
9.

国際会議録
国際会議録
9. Flashover performance of thin-wall spacers in field emission displays
Ma,X. ; Sudarshan,T.S.
出版情報: Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California.  pp.143-149,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3636
10.

国際会議録
国際会議録
10. Measuring rotating substrate temperature by laser
Lu,S. ; Ma,X. ; Shen,Y.
出版情報: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.860-863,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4086