1.

国際会議録
国際会議録
1. Optical system alignment via optical state estimation using wavefront measurements [5965-80]
Sigrist, N. ; Redding, D. C. ; Lou, J. Z. ; Zhang, Y. ; Basinger, S.
出版情報: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.596524-596526,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5965
2.

国際会議録
国際会議録
2. Optical state estimation using wavefront data (Invited Paper)
Redding, D. C. ; Sigrist, N. ; Lou, J. Z. ; Zhang, Y. ; Atcheson, P. D. ; Acton, D. S. ; Hayden, W. L.
出版情報: Current developments in lens design and optical engineering V : 4-5 August 2004, Denver, Colorado, USA.  pp.212-224,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5523
3.

国際会議録
国際会議録
3. JWST on-orbit multi-field wavefront control with a Kalman filter [5867-29]
Lou, J. Z. ; Redding, D. ; Sigrist, N. ; Zhang, Y. ; Basinger, S.
出版情報: Optical Modeling and Performance Predictions II.  pp.58670T-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5867