1.

国際会議録
国際会議録
1. METALLURGICAL AND ELECTRICAL CHARACTERISTICS OF MoA1X SCHOTTKY CONTACTS TO n-GaAs
Huang, T. S. ; Peng, J. G. ; Lin, C. C.
出版情報: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.511-518,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 260
2.

国際会議録
国際会議録
2. Formation of Zn-ZnO Polygon Prismatic Nanocrystals by Liquid Source via Thermal Vapor Transport
Liu, K. H. ; Lin, C. C. ; Chen, S. Y.
出版情報: Cross-disciplinary applied research in materials science and technology : proceedings of the 1st International Meeting on Applied Physics (APHYS-2003), Badajoz, Spain, October 13th-18th 2003.  pp.309-314,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 480-481
3.

国際会議録
国際会議録
3. Crystallization rate of PET by DSC analysis
Lin, C. C.
出版情報: Technical Papers : Plastics - Meeting Challenges of the Future : ANTEC '82, Annual Technical Conference and Exhibition of the Society of Plastics Engineers, 40, San Francisco Hilton,1982.5.10-13.  pp.901-903,  1982.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 28
4.

テクニカルペーパー
テクニカルペーパー
4. Control System Development for an Advanced-Technology Medium-Duty Electric Truck.
Lin, C. C. ; Peng, H. ; Grizzle, J. W. ; Liu, J. ; Busdiecker, M.
出版情報: 2003 International Truck and Bus Meeting and Exposition : SAE technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
シリーズ名: Society of Automotive Engineers technical paper series
シリーズ巻号: 2003
5.

国際会議録
国際会議録
5. Cryogenic aerosol cleaning of photomasks [5853-12]
Banerjee, S. ; Lin, C. C. ; Su, S. ; Chung, H. F. ; Brandt, W. ; Tang, K.
出版情報: Photomask and Next-Generation Lithography Mask Technology XII.  pp.90-99,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5853
6.

国際会議録
国際会議録
6. Evaluation and implementation of TeraScan reflected light die-to-database inspection mode for 65nm design node process [5992-07]
Hsu, L. T. H. ; Ho, C. H. ; Lin, C. C. ; Hsu, V. ; Chen, E. ; Yu, P. ; Son, K.
出版情報: 25th Annual BACUS Symposium on Photomask Technology.  pp.599207-599207,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5992
7.

国際会議録
国際会議録
7. Characterization of photomask surface cleaning with cryogenic aerosol technique [5922-54]
Banerjee, S. ; Lin, C. C. ; Su, S. ; Bowers, C. ; Chung, H. F. ; Brandt, W. ; Tang, K.
出版情報: 25th Annual BACUS Symposium on Photomask Technology.  pp.59921H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5992
8.

国際会議録
国際会議録
8. Aerial-image-based inspection on subresolution scattering bars
Hsu, L. T. H. ; Lin, C. C. ; Rosenbusch, A. ; Bloomberg, Y. ; Kurin, S.
出版情報: 24th Annual BACUS Symposium on Photomask Technology.  pp.36-45,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5567