1.

国際会議録
国際会議録
1. 1.5 ｦﾌm In0.53Al0.14Ga0.33As/In0.52Al0.48As Distributed Bragg Reflector and Single Cavity Active Layer Grown with In Situ Double-Beam Laser Reflectometry
Baek, Jong-Hyeob ; Lee, Bun ; Lee, Jin Hong ; Han, Won Seok ; Lee, El-Hang
出版情報: Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.  pp.159-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 450
2.

国際会議録
国際会議録
2. In-Situ Monitoring of MOCVD Grown InxAl1-xAs/GaAs Epitaxial Layers by Two Laser Beams Reflectometry
Baek, Jong-Hyeob ; Lee, Bun ; Choi, Sung Woo ; Lee, Jin Hong ; Lee, El-Hang
出版情報: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.115-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 406