In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland. pp.89-101, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas. Part2 pp.1288-1295, 2000. Bethel, CT. Society for Experimental Mechanics
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 1997 : industrial and commercial applications of smart structures technologies : 4-6 March 1997, San Diego, California. pp.281-294, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 1998 : industrial and commercial applications of smart structures technologies : 3-5 March 1998, San Diego, California. pp.167-173, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 1996 : Industrial and commercial applications of smart structures technologies : 27-29 February 1996, San Diego, California. pp.326-340, 1996. Bellingham. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering