1.

国際会議録
国際会議録
1. Application of the photoelastic fornography to three-dimensional measurement of birefringence in anisotropic microobjects [5878-19]
Kniazewski, P. ; Kozacki, T. ; Kujawinska, M.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5878
2.

国際会議録
国際会議録
2. Multifunctional interferometric platform for static and dynamic MEMS measurement [5878-07]
Kacperski, J. ; Kujawinska, M.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.587807-587807,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5878
3.

国際会議録
国際会議録
3. Application of microinterferometric tomography as an evaluation tool for phase micro-objects
Kniazewski, P. ; Krajewski, R. G. ; Kujawinska, M. ; Van Uffelen, M. ; Berghmans, F. ; Thienpont, H.
出版情報: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.596-604,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5776
4.

国際会議録
国際会議録
4. Phase manipulation and optoelectronic reconstruction of digital holograms by means of LCOS spatial light modulator
Michalkiewicz, A. ; Kujawinska, M. ; Krezel, J. ; Salbut, L. ; Wang, X. ; Bos, P. J.
出版情報: Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico.  pp.144-152,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5776
5.

国際会議録
国際会議録
5. Enhanced stereo visualisation of low-contrast microtissues by means of image processing and HMD technology
Kucharski, T. ; Kujawinska, M. ; Lesniewski, M. ; Niemczyk, K. ; Bruzgielewicz, A.
出版情報: Biophotonics micro- and nano-imaging : 28 April 2004, Strasbourg, France.  pp.37-44,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5462
6.

国際会議録
国際会議録
6. M(O)EMS-based integrated micro-interferometric system [6348-22]
Krezel, J. ; Salbut, L. ; Kujawinska, M.
出版情報: Optoelectronic and electronic sensors VI : 19-22 June 2006, Zakopane, Poland.  pp.63480M-,  2006.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6348
7.

国際会議録
国際会議録
7. Digital holographic interferometry system based on all fiber phase modulation [5952-12]
Michalkiewicz, A. ; Marc, P. ; Kujawinska, M. ; Jaroszewicz, L.R.
出版情報: Optical fibers : applications : 31 August-2 September, 2005, Warsaw, Poland.  pp.59520C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5952
8.

国際会議録
国際会議録
8. Three-dimensional reconstruction of refractive index distribution in optical phase elements by interferometric and photoelastic tomography
Kujawinska, M. ; Kniazewski, P.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.35-47,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5188
9.

国際会議録
国際会議録
9. Automated system for interferometric out-of-plane and in-plane microelements measurement
Kacperski, J.M. ; Sykula, T. ; Kujawinska, M. ; Salbut, L.A.
出版情報: Photonics applications in astornomy, communications, industry, and high-energy physics experiments : 23-26 May 2002, Wilga, Poland.  pp.427-433,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5125
10.

国際会議録
国際会議録
10. Development of standard measurement chain for full-field optical strain measurement methods
Salbut, L. ; Kujawinska, M. ; Patterson, E. ; Hack, E. ; Burguete, R. ; Whelan, M. ; Mendels, D.A.
出版情報: Interferometry XII: Applications.  pp.268-277,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5532