1.

国際会議録
国際会議録
1. Far Ultravioiet Spectroscopic Expiorer optlcal system: lessons learned
Conard,S.J. ; Barkhouser,R.H. ; Evans,J.P. ; Friedman,S.D. ; Kruk,J.W. ; Moos,H.W. ; Ohl,R.G. ; Sahnow,D.J.
出版情報: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.186-198,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4139
2.

国際会議録
国際会議録
2. FUSE: fine error sensor optical performance
Kruk,J.W. ; Chayer,P. ; Hutchings,J.B. ; Morbey,C.L. ; Murowinski,R.G.
出版情報: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.163-174,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4139
3.

国際会議録
国際会議録
3. FUSE attitude control: target recognition and fine guidance performance
Ake,T.B. ; Fisher,H.L. ; Kruk,J.W. ; Murphy,P.K. ; Oegerle,W.R.
出版情報: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.175-185,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4139
4.

国際会議録
国際会議録
4. Far Ultraviolet Spectroscopic Explorer: one year in orbit
Sahnow,D.J. ; Moos,H.W. ; Friedman,S.D. ; Blair,W.P. ; Conard,S.J. ; Kruk,J.W. ; Murphy,E.M. ; Oegerle,W.R. ; Ake,T.B.
出版情報: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.131-136,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4139
5.

国際会議録
国際会議録
5. Prelaunch optical tests and performance estimates of the Far-Ultraviolet Spectroscopic Explorer(FUSE)satellite
Friedman,S.D. ; Conard,S.J. ; Barkhouser,R.H. ; Brownsberger,K.R. ; Cha,A.N. ; Fullerton,A.W. ; Kruk,J.W. ; Moos,W. ; Murphy,E.M. ; Ohl,R.G. ; Sahnow,D.J. ; Weaver,H.A.
出版情報: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.460-469,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3765