Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58780J-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA. pp.58691C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photonics applications in astornomy, communications, industry, and high-energy physics experiments : 23-26 May 2002, Wilga, Poland. pp.409-413, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photonics applications in astornomy, communications, industry, and high-energy physics experiments : 23-26 May 2002, Wilga, Poland. pp.414-419, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II. pp.437-444, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
kniazewski, P. ; Kozacki, T. ; Kujawinska, K. ; Wolinski, R. T.
出版情報:
Optical Micro- and Nanometrology in Microsystems Technology. pp.61880H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering