1.

国際会議録
国際会議録
1. Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC
Bardeleben, H. J. von ; Cantin, J. L. ; Vickridge, I. ; Song, Y. ; Dhar, S. ; Feldman, L. C. ; Williams, J. R. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.277-282,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
2.

国際会議録
国際会議録
2. Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals
Bardeleben, H. J. von ; Cantin, J. L. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.273-276,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
3.

国際会議録
国際会議録
3. Diagnosing lung cancer by using fluorescence induced from small dose of hematoporphurin [5967-33]
Zhu, J. ; Xu, J. ; Ke, L. ; Zhang, H.
出版情報: 2004 Shanghai International Conference on Laser Medicine and Surgery.  pp.59670X-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5967