1.

国際会議録
国際会議録
1. Deep-level defects in semi-insulating LT MBE GaAs
Kozlowski,R. ; Kaminski,P. ; Kordos,P. ; Pawlowski,M. ; Cwirko,R.
出版情報: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.203-207,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4413
2.

国際会議録
国際会議録
2. Analysis of two-dimensional PITS spectra for characterization of defect centers in high-resistivity materials
Pawlowski,M. ; Miczuga,M. ; Kaminski,P. ; Kozlowski,R.
出版情報: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.208-213,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4413
3.

国際会議録
国際会議録
3. Technique of low-frequency noise versus temperature for identification of deep-level defects in semiconductor materials
Cwirko,J. ; Przybysz,C. ; Cwirko,R. ; Kaminski,P.
出版情報: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.218-221,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4413
4.

国際会議録
国際会議録
4. Electronic properties of grown-in defects in semi-insulating GaAs
Koztowski,R. ; Pawiowski,M. ; Kaminski,P. ; Cwirko,J.
出版情報: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.209-213,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3725
5.

国際会議録
国際会議録
5. The Effect of Deep Electron Traps on Luminescent Properties of VPE Te-Doped GaAs0.62P0.38 Epitaxial Layers
Kaminski,P. ; Nizinski,Z. ; Roszkiewicz,K.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.839-844,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
6.

国際会議録
国際会議録
6. High Resolution DLTS Studies of Transition-Metal-Related Defects in Silicon
Dobaczewski,L. ; Kaminski,P. ; Kozlowski,R. ; Surma,M.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.669-676,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
7.

国際会議録
国際会議録
7. High-resolution PITS studies of deep-level defects in semi-insulating GaAs and InP
Kaminski,P. ; Pawlowski,M. ; Kozlowski,R. ; Cwirko,R. ; Palczewska,M.
出版情報: Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland.  pp.246-250,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3178
8.

国際会議録
国際会議録
8. Digital analysis of photo-induced current transients in semi-insulating GaAs and InP
Kaminski,P. ; Pawlowski,M. ; Cwirko,R. ; Palczewska,M. ; Kozlowski,R.
出版情報: Metal/Nonmetal Microsystems: Physics, Technology, and Applications.  pp.133-136,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2780
9.

国際会議録
国際会議録
9. Electrically active defects in Ni-contaminated Cz-Si with oxygen precipitates
Kaminski,P. ; Kozlowski,R. ; Misiuk,A.
出版情報: Metal/Nonmetal Microsystems: Physics, Technology, and Applications.  pp.137-140,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2780