1.

国際会議録
国際会議録
1. Temperature Dependence of Shockley Stacking Fault Expansion and Contraction in 4H-SiC p-i-n Diodes
J.D. Caldwell ; R.E. Stahlbush ; O.J. Glembocki ; K.D. Hobart ; K.X. Liu
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.273-278,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
2.

国際会議録
国際会議録
2. Differences in Emission Spectra of Dislocations in 4H-SiC Epitaxial Layers
K.X. Liu ; X. Zhang ; R.E. Stahlbush ; M. Skowronski ; J.D. Caldwell
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.345-348,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
3.

国際会議録
国際会議録
3. Evolution of Basal Plane Dislocations during 4H-SiC Epitaxial Growth
R.E. Stahlbush ; B.L. VanMil ; K.X. Liu ; K.K. Lew ; R.L. Myers-Ward
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.317-320,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
4.

国際会議録
国際会議録
4. Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
R.L. Myers-Ward ; K.K. Lew ; B.L. VanMil ; R.E. Stahlbush ; K.X. Liu
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.481-484,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
5.

国際会議録
国際会議録
5. Whole-Wafer Mapping of Dislocations in 4H-SiC Epitaxy
R.E. Stahlbush ; K.X. Liu ; Q. Zhang ; J.J. Sumakeris
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.295-298,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557