1.

国際会議録
国際会議録
1. Linearity Analysis in Double Gate Graded-Channel Soi Devices Applied to 2-Mos Mosfet-C Balanced Structures
R.T. Doria ; A. Cerdeira ; J.-P. Raskin ; D. Flandre ; M.A. Pavanello
出版情報: Microelectonics Technology and Devices - SBMicro 2008.  pp.273-282,  2008.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 14(1)
2.

国際会議録
国際会議録
2. Characterizing the Effect of Uniaxial Strain on the Surface Roughness of Si Nanowire MEMS-Based Microstructures
E. Escobedo-Cousin ; S.H. Olsen ; T. Pardoen ; U. Bhaskar ; J.-P. Raskin
出版情報: Microelectromechanical systems--materials and devices IV : symposium held November 29-December 3, Boston, Massachusetts, U.S.A..  pp.155-160,  2011.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1299
3.

国際会議録
国際会議録
3. Operation of Double Gate Graded-Channel Transistors at Low Temperatures
M. A. Pavanello ; J. A. Martino ; T. M. Chung ; A. Kranti ; J.-P. Raskin ; D. Flandre
出版情報: Low temperature electronics and low temperature cofired ceramic based electronic devices : proceedings of the seventh International Symposium on Low Temperature Electronics and the International Symposium on Low Temperature Cofired CeramicBbased Electronic Devices.  pp.50-60,  2003.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2003-27
4.

国際会議録
国際会議録
4. Preconcentrator-based sensor µ-system for low-level benzene detection
P. Ivanov ; I. Gràcia ; F. Blanco ; J.-P. Raskin ; R. Cumeras
出版情報: Smart structures, devices, and systems IV : 10-12 December 2008, Melbourne, Australia.  pp.72680S-1-72680S-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7268