Michaelsen, C. ; Wiesmann, J. ; Hoffmann, C. ; Oehr, A. ; Storm, A.B. ; Seijbel, L.J.
出版情報:
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.211-219, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Storm, A.B. ; Michaelsen, C. ; Oehr, A. ; Hoffmann, C.
出版情報:
X-ray sources and optics : 2-3 August 2004, Denver, Colorado, USA. pp.177-181, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rauh, A. ; Briechle, K. ; Hanebeck, U.D. ; Hoffmann, C. ; Bamberger, J. ; Grigoras, M.
出版情報:
Location services and navigation technologies : 24 April 2003, Oriando, Florida, USA. pp.39-50, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In situ composites IV : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.69-84, 1982. New York. North-Holland
Michaelsen, C. ; Wiesmann, J. ; Hoffmann, C. ; Wulf, K. ; Bruegemann, L. ; Storm, A.
出版情報:
X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.143-151, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hoffmann, C. ; Lefloch, F. ; Quirion, D. ; Sanquer, M.
出版情報:
Noise and Information in Nanoelectronics, Sensors, and Standards. pp.20-30, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering