Schroeder, S. ; Kamprath, M. ; Gliech, S. ; Duparre, A.
出版情報:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58780T-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Schroder, s. ; Ratteit, J. ; Gliech, S. ; Duparre, A.
出版情報:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.587813-587813, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Burkert, A.. ; Muhlig, C. ; Triebel, W. ; Keutel, D. ; Natura, U. ; Parthier, L. ; Gliech, S. ; Schroder, S. ; Duparre, A.
出版情報:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58780E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hultaker, A. ; Gliech, S. ; Gessner, H. ; Duparre, A.
出版情報:
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.119-126, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hultaker, A. ; Gliech, S. ; Benkert, N. ; Duparre, A.
出版情報:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA. pp.115-122, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59651B-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Clausnitzer, T. ; Kley, E.-B. ; T-nnermann, A. ; Bunkowski, A. ; Burmeister, O. ; Danzmann, K. ; Schnabel, R. ; Duparre, A. ; Gliech, S.
出版情報:
Advances in thin film coatings for optical applications II : 1-2 August 2005, San Diego, California, USA. pp.58700J-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Gliech, S. ; Gessner, H. ; Hultaker, A. ; Duparre, A.
出版情報:
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.137-145, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Nickel, D. ; Fleig, C. ; Erhard, A. ; Letsch, A. ; Giesen, A. ; Jupe, M. ; Starke, K. ; Ristau, D. ; Wilhelm, O. ; Huber, R.A. ; Haspel, R. ; Schuhmann, U. ; Scharfenorth, C. ; Eichler, H.J. ; Gliech, S. ; Duparre, A. ; Schulz-Grosser, M. ; Krasilnikova, A. ; Haise, A. ; Riede, W. ; Balachninaite, O. ; Grigonis, R. ; Sirutkaitis, V. ; Kazakevich, V.
出版情報:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.520-526, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hultaker, A. ; Benkert, N. ; Gliech, S. ; Duparre, A.
出版情報:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.444-451, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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